Morphology and bonding measured from boron‐nitride powders and films using near‐edge x‐ray absorption fine structure
Morphology and bonding measured from boron‐nitride powders and films using near‐edge x‐ray absorption fine structure
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使用近边缘 X 射线吸收精细结构测量氮化硼粉末和薄膜的形态和键合
DOI：
10.1116/1.579194
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发表时间：
1994
期刊：
影响因子：
--
通讯作者：
T. Sato
中科院分区：
文献类型：
--
作者：
L. Terminello;A. Chaiken;D. Lapiano‐Smith;G. Doll;T. Sato
用芯级光吸收法研究了六方相、立方相(闪锌矿)、菱面体相和纤锌矿相氮化硼的成键。在硼和氮的1s光吸收截面中，我们观察到每个相唯一的共振，并且与存在的sp2或sp3键有关。然后，这些光谱标准被用来表征基于其芯级光吸收的BN非相干薄膜的成键和形貌。所研究的薄膜以SP2(类六方)键为主，并有一些SP3(立方相)键的证据。
Bonding in the hexagonal, cubic (zincblende), rhombohedral, and wurtzite phases of boron nitride was characterized using core‐level photoabsorption. In the boron and nitrogen 1s photoabsorption cross section we observed resonances that were unique to each of the phases and that were associated with the sp2 or sp3 bonding present. These spectroscopic standards were then used to characterize the bonding and morphology in an incoherent thin film of BN based on its core‐level photoabsorption. The film studied had predominantly sp2 (hexagonal‐like) bonding with some evidence of sp3 (cubic‐phase) bonds.