Mueller matrix microscope with a dual continuous rotating compensator setup and digital demodulation
Mueller matrix microscope with a dual continuous rotating compensator setup and digital demodulation
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DOI：
10.1364/ao.53.002236
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发表时间：
2014-04-01
期刊：
影响因子：
1.9
通讯作者：
Bertran, Enric
中科院分区：
文献类型：
--
作者：
Arteaga, Oriol;Baldris, Marta;Bertran, Enric
本文描述了一种新的Mueller矩阵（MM）显微镜，它使偏振光显微镜技术得以推广和定量化。在该仪器中，MU的所有元素都是从相机的每个像素处的光束的时间依赖强度的频域中的分析中同时确定的。强度的变化是由两个补偿器以不同的角频率连续旋转产生的。一个典型的测量在一分钟多一点的时间内完成，它可以应用于任何可见波长。给出了一些例子来演示该仪器的功能。(C)2014年美国光学学会
In this paper we describe a new Mueller matrix (MM) microscope that generalizes and makes quantitative the polarized light microscopy technique. In this instrument all the elements of the MU are simultaneously determined from the analysis in the frequency domain of the time-dependent intensity of the light beam at every pixel of the camera. The variations in intensity are created by the two compensators continuously rotating at different angular frequencies. A typical measurement is completed in a little over one minute and it can be applied to any visible wavelength. Some examples are presented to demonstrate the capabilities of the instrument. (C) 2014 Optical Society of America