Use of the atomic force microscope to determine the effect of substratum surface topography on bacterial adhesion
Use of the atomic force microscope to determine the effect of substratum surface topography on bacterial adhesion
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DOI：
10.1021/la011142p
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发表时间：
2002-03-19
期刊：
影响因子：
3.9
通讯作者：
Bhakoo, M
中科院分区：
文献类型：
--
作者：
Boyd, RD;Verran, J;Bhakoo, M
已知宏观尺度上表面粗糙度和地形的变化会影响细菌附着和保留。关于微米和亚微米尺度上表面形貌的变化如何影响细菌附着于基质的强度，几乎没有定量信息。描述了一种新的方法，使用原子力显微镜，其中使用不同的剪切/横向力（以纳牛顿计）从不同表面形貌的各种基质中分离单个细菌细胞。表面形貌中0.1 μ m的横向变化足以影响细菌附着的强度。施加的力从4到8 nN的增加是必要的，以移动保留在约1 μ m宽和0.2 μ m深的表面缺陷与细胞附着在光滑表面上相比，细菌。
Changes in surface roughness and topography on the macroscopic scale are known to affect bacterial attachment and retention. Little quantitative information is available as to how changes in surface topography on the micron and submicron scale affect the strength of bacterial attachment to substrata. A novel method is described using the atomic force microscope where a varying shear/lateral force (in nanonewtons) is used to detach individual bacterial cells from various substrata of different surface topographies. Lateral changes of 0.1 mum in the surface topography are sufficient to affect the strength of bacterial attachment. An increase in applied force from 4 to 8 nN was necessary to move bacteria retained in surface defects of approximately 1 mum wide and 0.2 mum deep compared with cells attached on smooth surfaces.