Determining the continuous thermo-optic coefficients of chalcogenide glass thin films in the MIR region using FTIR transmission spectra.
Determining the continuous thermo-optic coefficients of chalcogenide glass thin films in the MIR region using FTIR transmission spectra.
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DOI：
10.1364/oe.27.022275
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发表时间：
2019-08
期刊：
影响因子：
3.8
通讯作者：
Yuanrong Fang;D. Furniss;D. Jayasuriya;H. Parnell;Zhuoqi Tang;A. Seddon;T. Benson
中科院分区：
文献类型：
--
作者：
Yuanrong Fang;D. Furniss;D. Jayasuriya;H. Parnell;Zhuoqi Tang;A. Seddon;T. Benson
介绍了一种测量透明薄膜中红外连续热光系数的新方法(FTIR连续dN/dT法，n为折射率和T温度)。这项技术是基于在不同温度下测量的傅里叶变换红外(FTIR)透射谱。结果表明，该方法可以成功地测定Ge_(20)Sb_(10)Se_(70)At的硫系玻璃薄膜的热光系数。%(原子%)和Ge16As24Se15.5Te44.5 at.%)，在6~20µm波长范围内，测量精度误差小于±11.5 ppm/°C，精度远优于棱镜最小偏差法和改进的斯瓦内普尔法。
A new method (FTIR continuous dn / dT method, n is refractive index and T temperature) for measuring the continuous thermo-optic coefficients of thin transparent films in the mid-infrared (MIR) spectral region is introduced. The technique is based on Fourier transform infrared (FTIR) transmission spectra measured at different temperatures. It is shown that this method can successfully determine the thermo-optic coefficient of chalcogenide glass thin films (of batch compositions Ge20Sb10Se70 at. % (atomic %) and Ge16As24Se15.5Te44.5 at. %) over the wavelength range from 2 to 25 µm. The measurement precision error is less than ± 11.5 ppm / °C over the wavelength range from 6 to 20 µm. The precision is much better than that provided by the prism minimum deviation method or an improved Swanepoel method.