Characterization and Analysis of Relative Intensity Noise in Broadband Optical Sources for Optical Coherence Tomography.

Characterization and Analysis of Relative Intensity Noise in Broadband Optical Sources for Optical Coherence Tomography.
复制标题

DOI:
10.1109/lpt.2010.2050058
复制
发表时间:
2010
期刊:
IEEE photonics technology letters : a publication of the IEEE Laser and Electro-optics Society
影响因子:
--
通讯作者:
Boppart SA
Boppart SA
中科院分区:
其他
文献类型:
--
作者:
Shin S;Sharma U;Tu H;Jung W;Boppart SA

文献摘要

被引文献

相似文献

相对强度噪声(RIN)是限制光学相干层析成像(OCT)系统灵敏度的重要因素之一。用于估计OCT中各种光源的RIN的现有和流行的理论是有问题的,并且不能均匀地应用于不同类型的源。由于光子产生的物理性质不同,各种源中噪声的来源有很大不同。在这项研究中,我们表征和比较RIN的几个OCT光源,包括超辐射发光二极管(SLDs),掺铒光纤放大器,复用SLDs,和连续波激光器。我们还报告了一种方法,通过使用增益饱和的半导体光放大器放大SLD的光输出,以减少RIN。
Relative intensity noise (RIN) is one of the most significant factors limiting the sensitivity of an optical coherence tomography (OCT) system. The existing and prevalent theory being used for estimating RIN for various light sources in OCT is questionable, and cannot be applied uniformly for different types of sources. The origin of noise in various sources differs significantly, owing to the different physical nature of photon generation. In this study, we characterize and compare RIN of several OCT light sources including superluminescent diodes (SLDs), an erbium-doped fiber amplifier, multiplexed SLDs, and a continuous-wave laser. We also report a method for reduction of RIN by amplifying the SLD light output by using a gain-saturated semiconductor optical amplifier.