Surface Scattering Experiments with Conduction Electrons
Surface Scattering Experiments with Conduction Electrons
复制标题
传导电子的表面散射实验
DOI：
10.1007/bfb0107230
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发表时间：
1992
期刊：
影响因子：
--
通讯作者：
D. Schumacher
中科院分区：
文献类型：
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作者：
D. Schumacher
传导电子的表面散射实验显示了这个过程如何可以用来研究薄金属膜的表面过程。由于薄膜在一个方向上的尺寸与传导电子的平均自由程相当，因此这种薄膜既是基底又是传感器，必须通过本文所述的其他表面分析方法进行表征。还讨论了如何直流电阻率测量允许研究的表面过程，如吸附，解吸，表面扩散到晶体生长。此外，原位观察外延生长被证明是可能的。从而阐明了叠加金属薄膜和超晶格的电子结构。这是所有表面物理学家的重要课题。
Surface Scattering Experiments with Conduction Electrons shows how this process can be used to investigate surface processes of thin metal films. Since a thin film is in one direction of a size comparable to the mean free path of the conduction electrons, such a film is both substrate and sensor and must be characterized by other surface-analytical methodsas demonstrated here. Also discussed is how the dc-resistivity measurement permits the study of surface processes such as adsorption, desorption, and surface diffusion up to crystalline growth. The in situ observation of epitaxial growth is additionally shown to be possible. Thus the electronic structure of superimposed metal films and superlattices can be elucidated. This is an essential topic for all surface physicists.