Effects of irradiation temperature on the response of CeO2, ThO2, and UO2 to highly ionizing radiation
Effects of irradiation temperature on the response of CeO2, ThO2, and UO2 to highly ionizing radiation
复制标题
辐照温度对CeO2、ThO2和UO2高电离辐射响应的影响
DOI:
10.1016/j.jnucmat.2019.07.029
复制
发表时间:
2019
影响因子:
3.1
通讯作者:
M. Lang
中科院分区:
文献类型:
--
作者:
W. Cureton;R. Palomares;C. Tracy;Eric C. O’Quinn;J. Walters;M. Zdorovets;R. Ewing;M. Toulemonde;M. Lang
Microcrystalline CeO2, ThO2, and UO2were irradiated with 198 MeV132Xe ions to the same fluence at temperatures ranging from 25 °C to 700 °C then characterized by synchrotron X-ray diffraction and X-ray absorption spectroscopy. All samples retain crystallinity and their nominal fluorite-type phase at a fluence of 1.5 × 1013ions/cm2. Both CeO2and ThO2display defect-induced unit cell expansion after irradiation at room temperature (∼0.15% and ∼0.10%, respectively), yet as irradiation temperature increases, the maximum swelling produced decreases to ∼0.02%. Alternatively, UO2shows an initial contraction in unit cell parameter (approximately −0.05%) for room temperature irradiation, most likely related to irradiation-enhanced annealing or irradiation-induced oxidation. At higher temperatures (above 200 °C) UO2begins to swell, surpassing its unit cell parameter prior to irradiation (∼0.05%), an effect which could be attributed to minor reduction in uranium oxidation state in vacuum. However, while CeO2irradiated at room temperature undergoes partial reduction, both UO2and ThO2exhibit no measurable change in cation oxidation state as evidenced by X-ray absorption spectroscopy. All samples display a decrease in irradiation-induced heterogeneous microstrain as a function of increasing irradiation temperature.
DOI:
10.1016/0001-6160(53)90006-6
发表时间:
1953-01-01
期刊:
ACTA METALLURGICA
影响因子:
--
作者:
WILLIAMSON, GK;HALL, WH
通讯作者:
HALL, WH