Charge storage mechanism of nanostructured anhydrous and hydrous ruthenium-based oxides
Charge storage mechanism of nanostructured anhydrous and hydrous ruthenium-based oxides
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DOI：
10.1016/j.electacta.2006.02.054
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发表时间：
2006-12-01
影响因子：
6.6
通讯作者：
Takasu, Yoshio
中科院分区：
文献类型：
--
作者：
Sugimoto, Wataru;Yokoshima, Katsunori;Takasu, Yoshio
采用循环伏安法、流体动力伏安法、计时伏安法和电化学阻抗谱等电化学技术，对纳米结构无水钌基氧化物和有水钌基氧化物的电荷存储机制进行了评价。考察了粒径、含水状态和结构等因素对赝电容性能的影响。估计了电极材料单位质量和表面积的双电层电容（C-d1）、吸附相关电荷（C-ad）和不可逆氧化还原相关电荷（C-irr），并讨论了结构水在材料内微孔或层间的作用。(c) 2006 Elsevier Ltd.版权所有。
The charge storage mechanism of nanostructured anhydrous and hydrous ruthenium-based oxides was evaluated by various electrochemical techniques (cyclic voltammety, hydrodynamic voltammetry, chronoamperometry, and electrochemical impedance spectroscopy). The effects of various factors, such as particle size, hydrous state, and structure, on the pseudocapacitive property were characterized. The electric double layer capacitance (C-d1), adsorption related charge (C-ad), and the irreversible redox related charge (C-irr) per unit mass and surface area of electrode material has been estimated and the role of structural water within the material either in micropores or interlayer are discussed. (c) 2006 Elsevier Ltd. All rights reserved.