Influence of external contacting on electroluminescence and fill factor measurements
Influence of external contacting on electroluminescence and fill factor measurements
复制标题
DOI：
10.1016/j.solmat.2016.03.039
复制
发表时间：
2016-08
影响因子：
6.9
通讯作者：
H. Höffler;J. Haunschild;S. Rein
中科院分区：
文献类型：
--
作者：
H. Höffler;J. Haunschild;S. Rein
太阳能电池上的电致发光成像结合光致发光成像允许提取关于局部太阳能电池质量的空间分辨信息。在过去已经引入了许多用于提取空间分辨参数的方法。对电致发光图像有强制性影响的一个重要因素尚未详细讨论。该因素是外部接触方案或错误接触对测量结果的影响。在这项工作中，我们讨论了外部接触方案的影响的外观上的电致发光图像和图像的空间分辨的串联电阻计算从电致发光图像在不同的操作点。此外，我们讨论了错误的接触填充因子测量的影响。我们发现，错误的接触填充因子测量的影响变得更大，如果母线电阻变得更大。因此，朝向具有较高电阻的较薄母线的工业趋势激发了用于硅太阳能电池的在线电流电压测量的基于电致发光的质量控制。
Electroluminescence imaging combined with photoluminescence imaging on solar cells allows extracting spatially resolved information on local solar cell quality. Numerous methods for the extraction of spatially resolved parameters have been introduced in the past. An important factor, which has mandatory influence on electroluminescence images, has not been discussed in detail yet. This factor is the influence of the external contacting scheme or erroneous contacting on the measurement results. In this work we discuss the influence of the external contacting scheme on the appearance of electroluminescence images and images of the spatially resolved series resistance which are calculated from electroluminescence images taken at different operating points. Furthermore we discuss the impact of erroneous contacting on fill factor measurements. We show that the impact of erroneous contacting on fill factor measurements becomes larger if busbar resistances become larger. The industrial trend towards thinner busbars with higher resistances hence motivates an electroluminescence based quality control for inline current voltage measurements of silicon solar cells.