Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method
Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method
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DOI：
10.1063/1.4977238
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发表时间：
2017-02
影响因子：
3.2
通讯作者：
K. Motoki;Yu Miyazawa;D. Kobayashi;M. Ikegami;T. Miyasaka;Tomoyuki Yamamoto;K. Hirose
中科院分区：
文献类型：
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作者：
K. Motoki;Yu Miyazawa;D. Kobayashi;M. Ikegami;T. Miyasaka;Tomoyuki Yamamoto;K. Hirose
用X射线光电子能谱(XPS)随时间变化的测量方法研究了软X射线辐照对CH3NH3PbI3钙钛矿结构的影响。采用逆温晶化法制备了晶态样品。记录了芯能级和价带光谱的时间演化，分别确定了样品的组份比和价带电子结构。此外，对价带XPS谱进行了第一性原理计算。原位XPS分析结合理论计算表明，由于甲基碘化铵的蒸发，CH3NH3PbI3钙钛矿表面降解为PbI2。
The effects of soft X-ray exposure on structures of CH3NH3PbI3 perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-level and valence-band spectra were recorded to determine the compositional ratios and valence band electronic structure of the sample, respectively. In addition, first-principles calculations were conducted to evaluate the valence band XPS spectra. The in situ XPS analysis combined with theoretical calculations demonstrated a degradation of the surface of CH3NH3PbI3 perovskite into PbI2 owing to the evaporation of methylammonium iodide.