Core level photoionization on free sub-10-nm nanoparticles using synchrotron radiation.
Core level photoionization on free sub-10-nm nanoparticles using synchrotron radiation.
复制标题
使用同步加速器辐射对自由亚 10 nm 纳米粒子进行核心级光电离。
DOI：
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发表时间：
2010
影响因子：
1.6
通讯作者：
E. Rühl
中科院分区：
文献类型：
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作者：
J. Meinen;S. Khasminskaya;M. Eritt;T. Leisner;E. Antonsson;B. Langer;E. Rühl
提出了一种新颖的仪器，它允许在软 X 射线范围内使用同步加速器辐射研究直径范围为 1 至 30 nm 的单电荷自由纳米颗粒。它由高压纳米粒子源、高效纳米粒子束入口和电子飞行时间光谱仪组成，适用于探测自由悬浮纳米粒子的表面和整体特性。我们展示了在纳米粒子束中制备的 8.2 nm SiO(2) 粒子的 Si L(3,2) 边缘附近的 X 射线光电子能谱研究结果。强调了该装置在纳米尺寸颗粒表面化学反应方面的可能用途。这种方法有潜力用于非均相大气化学的过程研究。
A novel instrument is presented, which permits studies on singly charged free nanoparticles in the diameter range from 1 to 30 nm using synchrotron radiation in the soft x-ray regime. It consists of a high pressure nanoparticle source, a high efficiency nanoparticle beam inlet, and an electron time-of-flight spectrometer suitable for probing surface and bulk properties of free, levitated nanoparticles. We show results from x-ray photoelectron spectroscopy study near the Si L(3,2)-edge on 8.2 nm SiO(2) particles prepared in a nanoparticle beam. The possible use of this apparatus regarding chemical reactions on the surface of nanometer-sized particles is highlighted. This approach has the potential to be exploited for process studies on heterogeneous atmospheric chemistry.