Direct observation of X-ray induced Atomic Motion using STM combined with Synchrotron Radiation
Direct observation of X-ray induced Atomic Motion using STM combined with Synchrotron Radiation
复制标题
使用 STM 结合同步辐射直接观察 X 射线诱导原子运动
DOI:
10.1166/jnn.2011.3916
复制
发表时间:
2011
期刊:
影响因子:
--
通讯作者:
and M. Aono
中科院分区:
文献类型:
--
作者:
A. Saito;T . Tanaka;Y . Takagi;H. Hosokawa;H.Notsu;G .Ohzeki;Y .Tanaka;Y .Kohmura;M.Akai-Kasaya;T .Ishikawa;Y .Kuwahara;S.Kikuta;and M. Aono
X-ray induced atomic motion on a Ge(111)-c(2 × 8) clean surface at room temperature was directly observed with atomic resolution using a synchrotron radiation (SR)-based scanning tunneling microscope (STM) system under ultra high vacuum condition. The atomic motion was visualized as a tracking image by developing a method to merge the STM images before and after X-ray irradiation. Using the tracking image, the atomic mobility was found to be strongly affected by defects on the surface, but was not dependent on the incident X-ray energy, although it was clearly dependent on the photon density. The atomic motion can be attributed to surface diffusion, which might not be due to core-excitation accompanied with electronic transition, but a thermal effect by X-ray irradiation. The crystal surface structure was possible to break even at a lower photon density than the conventionally known barrier. These results can alert X-ray studies in the near future about sample damage during measurements, while suggesting the possibility of new applications. Also the obtained results show a new availability of the in-situ SR-STM system.