Observation of Longitudinal Spin Seebeck Voltage in YIG Films Chemically Prepared by Co-Precipitation and Spin Coating
Observation of Longitudinal Spin Seebeck Voltage in YIG Films Chemically Prepared by Co-Precipitation and Spin Coating
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DOI：
10.1109/tmag.2018.2865199
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发表时间：
2019-02
影响因子：
2.1
通讯作者：
Keisuke Yamada;Y. Kurokawa;Kazuma Kogiso;H. Yuasa;M. Shima
中科院分区：
文献类型：
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作者：
Keisuke Yamada;Y. Kurokawa;Kazuma Kogiso;H. Yuasa;M. Shima
研究了在Si衬底上化学制备的具有SiO2表面层的Y3 Fe 5 O 12（YIG）薄膜的纵向自旋Seebeck效应（LSSE），重点研究了其对用于测量的覆盖层金属（Pt或W）的依赖性。钇铁石榴石薄膜是通过共沉淀、旋涂和退火工艺的组合来制备的。通过X射线衍射的结构表征证明，该薄膜是多晶的石榴石相，平均晶粒尺寸为~34 nm。用扫描电子显微镜和扫描探针显微镜对薄膜表面的微观结构进行了分析，结果表明薄膜表面的粗糙度Ra约为31 nm。YIG薄膜的易磁化轴方向与薄膜平行。我们已经发现，测量的LSSE电压V_{\text {LSSE}}$的极性与Pt覆盖层时观察到的W覆盖层明显不同。V_{\text {LSSE}}$的值几乎随温差T $\Delta T$的增加而线性增加，与覆盖层的金属选择无关。所观察到的多晶YIG薄膜的LSSE是一个数量级小于YIG和Bi：YIG单晶样品生长的金属有机分解。
Longitudinal spin Seebeck effect (LSSE) of Y3Fe5O12 (YIG) thin films chemically prepared on a Si substrate with a SiO2 surface layer has been investigated with a particular focus on its dependence on the metal (Pt or W) for the capping layer used to carry out the measurements. The YIG films are prepared by a combination of co-precipitation, spin coating, and annealing processes. The structural characterization by X-ray diffraction proves that the films are polycrystalline in a garnet phase with an average crystallite size of ~34 nm. The microstructural analyses of the film surface by scanning electron microscopy and scanning probe microscopy show that the roughness $R_{a}$ of the film is ~31 nm. The magnetic easy axis of the YIG films is in the direction parallel to the films. We have found that the polarity of the LSSE voltage $V_{\text {LSSE}}$ measured with a Pt capping layer apparently differs from that observed when a W capping layer is used. The value of $V_{\text {LSSE}}$ increases almost linearly with increasing temperature difference $\Delta T$ independent of the choice of metal for the capping layer. The observed LSSE for the polycrystalline YIG films is one order of magnitude smaller than that reported for YIG and Bi:YIG single-crystal samples grown by metal–organic decomposition.