Characterization of SEI Layers on LiMn2O4 Cathodes with In Situ Spectroscopic Ellipsometry
Characterization of SEI Layers on LiMn2O4 Cathodes with In Situ Spectroscopic Ellipsometry
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DOI：
10.1149/1.1867652
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发表时间：
2004-08
影响因子：
3.9
通讯作者：
J. Lei;Lingjie Li;R. Kostecki;R. Muller;F. Mclarnon
中科院分区：
文献类型：
--
作者：
J. Lei;Lingjie Li;R. Kostecki;R. Muller;F. Mclarnon
采用椭圆偏振光谱法原位研究了薄膜LiMn{sub 2}O{sub 4}电极上SEI膜形成的初始阶段。发现在将电极暴露于EC/DMC（体积比1：1）1.0M LiPF{sub 6}电解质时立即形成SEI层。然后，SEI层厚度与经过时间的对数函数成比例地增加。相比之下，循环电极上的SEI层厚度与循环次数的线性函数成比例地增加。
In situ spectroscopic ellipsometry was employed to study the initial stage of SEI layer formation on thin-film LiMn{sub 2}O{sub 4} electrodes. It was found that the SEI layer formed immediately upon exposure of the electrode to EC/DMC (1:1 by vol) 1.0 M LiPF{sub 6} electrolyte. The SEI layer thickness then increased in proportion to a logarithmic function of elapsed time. In comparison, the SEI layer thickness on a cycled electrode increased in proportion to a linear function of the number of cycles.