Measurement of low-level strain retardation in optical materials
Measurement of low-level strain retardation in optical materials
复制标题
光学材料中低水平应变延迟的测量
DOI：
10.1117/12.278974
复制
发表时间：
1997
影响因子：
1.7
通讯作者：
T. Oakberg
中科院分区：
文献类型：
--
作者：
T. Oakberg
本文介绍一种测量光学元件和材料中低水平应变双折射的方法。这种方法提供了同时测量的幅度和方向的净延迟，而无需样品旋转。测量延迟和独立测量的聚合物波片之间获得了良好的协议。测量还进行了未校准的样品与延迟幅度下降到1.5纳米。
A method for measurement of low-level strain birefringence in optical elements and materials will be described. This method provides for the simultaneous measurement of magnitude and direction of the net retardation without the necessity of sample rotation. Good agreement was obtained between measured retardation and independent measurements of a polymer waveplate. Measurements were also made of uncalibrated samples with retardation magnitudes down to 1.5 nanometers.