Luminous Properties and Thermal Reliability of Screen-Printed Phosphor-in-Glass-Based White Light-Emitting Diodes

Luminous Properties and Thermal Reliability of Screen-Printed Phosphor-in-Glass-Based White Light-Emitting Diodes
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DOI:
10.1109/ted.2016.2645285
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发表时间:
2017-01
影响因子:
3.1
通讯作者:
Yang Peng;Ruixin Li;Simin Wang;Zhen Chen;Lei Nie;Mingxiang Chen
Yang Peng;Ruixin Li;Simin Wang;Zhen Chen;Lei Nie;Mingxiang Chen
中科院分区:
工程技术2区
文献类型:
--
作者:
Yang Peng;Ruixin Li;Simin Wang;Zhen Chen;Lei Nie;Mingxiang Chen

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本文系统地研究了基于玻璃荧光粉(PiG)的白色发光二极管(WLED)的发光特性和热可靠性。通过丝网印刷和低温烧结的方法,将黄色YAG:Ce 3+荧光粉嵌入到硼硅酸盐玻璃中,制备了荧光粉。研究了烧结温度、荧光粉含量、荧光粉层厚度等工艺参数对荧光粉发光性能的影响,得到了优化的荧光粉发光材料。在700 mA的驱动电流下,该模块的发光效率为114 lm/W,相关色温为5524 K,显色指数为69。此外,在200 °C下热老化500 h后,PiG的光致发光强度仅降低了4.3%,远低于传统的有机硅中磷光体(PiS)的26.2%。在100 °C下热老化1000 h后,基于PiG和PiS的WLED模块的LE损耗分别为4.2%和12.1%。老化实验结果表明,该材料具有上级的热稳定性,可用于制备具有高热稳定性的PIG基WLED。
This paper systematically investigates the luminous properties and thermal reliability of phosphor-in-glass (PiG)-based white light-emitting diodes (WLEDs). The PiG was prepared by introducing yellow YAG:Ce3+ phosphor embedded with borosilicate glass through screen-printing and low-temperature sintering. The effects of sintering temperature, phosphor content, and phosphor layer thickness were studied, and then the optimized PiG was achieved. This PiG-based WLED module yields a luminous efficacy (LE) of 114 lm/W, a correlated color temperature of 5524 K, and a color rendering index of 69 at the driving current of 700 mA. Furthermore, after thermal aging test at 200 °C for 500 h, the photoluminescence intensity of PiG is only reduced by 4.3%, which is much lower than the conventional phosphor-in-silicone (PiS) of 26.2%. The LE losses of PiG-based and PiS-based WLED modules are 4.2% and 12.1% after thermal aging of 1000 h at 100 °C, respectively. The aging results show that the proposed PiG exhibits superior thermal stability characteristic, which promises the excellent thermal reliability for PiG-based WLEDs.