Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy.
Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy.
复制标题
DOI：
10.1364/ol.35.000712
复制
发表时间：
2010-03
期刊：
影响因子：
3.6
通讯作者：
Peng Gao;I. Harder;V. Nercissian;K. Mantel;Baoli Yao
中科院分区：
文献类型：
--
作者：
Peng Gao;I. Harder;V. Nercissian;K. Mantel;Baoli Yao
提出了一种用于定量相位显微镜的新型共光路和在线点衍射干涉仪。该干涉仪的构造是在点衍射干涉仪中引入光栅对，从而形成物体波和参考波的共路径和串联配置。消色差相移是通过沿其光栅矢量方向线性移动两个光栅之一来实现的。通过理论分析和实验证明了所提出配置的可行性。
A new common-path and in-line point-diffraction interferometer for quantitative phase microscopy is proposed. The interferometer is constructed by introducing a grating pair into the point-diffraction interferometer, thus forming a common-path and in-line configuration for object and reference waves. Achromatic phase shifting is implemented by linearly moving one of the two gratings in its grating vector direction. The feasibility of the proposed configuration is demonstrated by theoretical analysis and experiments.