Effects of roughness and temperature on low-energy hydrogen positive and negative ion reflection from silicon and carbon surfaces
Effects of roughness and temperature on low-energy hydrogen positive and negative ion reflection from silicon and carbon surfaces
复制标题
粗糙度和温度对硅和碳表面低能氢正负离子反射的影响
DOI：
10.1063/1.4855455
复制
发表时间：
2014
影响因子：
1.6
通讯作者：
and H. Yamaoka
中科院分区：
文献类型：
--
作者：
N. Tanaka;S. Kato;T. Miyamoto;M. Nishiura;K. Tsumori;Y. Matsumoto;T. Kenmotsu;A. Okamoto;S. Kitajima;M. Sasao;M. Wada;and H. Yamaoka
