Low-noise charge injection in the CCD22
Low-noise charge injection in the CCD22
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CCD22 中的低噪声电荷注入
DOI：
10.1117/12.551393
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发表时间：
2004
期刊：
影响因子：
--
通讯作者：
D. Morris
中科院分区：
文献类型：
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作者：
D. R. Smith;A. Holland;I. Hutchinson;A. Abbey;P. Pool;D. Burt;D. Morris
电荷耦合器件（CCD）上包含电荷注入结构可以减轻由辐射引起的电荷捕获缺陷引起的电荷转移损失。当注入电荷扫过器件时，CCD 像素中存在的任何陷阱都会被注入电荷填充，因此，随后采集的图像中的电荷传输效率得到提高。迄今为止，已经制造出多种不同类型的 CCD，采用多种电荷注入技术。 XMM-Newton 的 EPIC MOS 焦平面仪器中使用的 e2v Technologies CCD22 就是此类设备之一，也是本文的主题。详细了解电荷注入操作以及使用电荷注入来减轻由于 CCD 辐射损坏而造成的电荷转移损失，将有利于未来计划的许多太空项目，包括 ESA GAIA 和 X 射线演化宇宙光谱 (XEUS) 任务。介绍了 CCD22 的电荷注入结构和操作模式，然后详细分析了器件列上电荷注入幅度的均匀性和可重复性。还介绍了质子照射对电荷注入特性的影响，特别是辐射引起的亮像素对注入电荷水平的影响。
The inclusion of a charge injection structure on a charge coupled device (CCD) allows for the mitigation of charge transfer loss which can be caused by radiation induced charge trapping defects. Any traps present in the pixels of the CCD are filled by the injected charge as it is swept through the device and consequently, the charge transfer efficiency is improved in subsequently acquired images. To date, a number of different types of CCD have been manufactured featuring a variety of charge injection techniques. The e2v Technologies CCD22, used in the EPIC MOS focal plane instruments of XMM-Newton, is one such device and is the subject of this paper. A detailed understanding of charge injection operation and the use of charge injection to mitigate charge transfer losses resulting from radiation damage to CCDs will benefit a number of space projects planned for the future, including the ESA GAIA and X-ray Evolving Universe Spectrometry (XEUS) missions. The charge injection structure and mode of operation of the CCD22 are presented, followed by a detailed analysis of the uniformity and repeatability of the charge injection amplitude across the columns of the device. The effects of proton irradiation on the charge injection characteristics are also presented, in particular the effect of radiation induced bright pixels on the injected charge level.