Magnetic and structural properties of CoFeB thin films grown by pulsed laser deposition
Magnetic and structural properties of CoFeB thin films grown by pulsed laser deposition
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DOI：
10.1088/2053-1591/abc124
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发表时间：
2020-10-01
影响因子：
2.3
通讯作者：
Backes, Dirk
中科院分区：
文献类型：
--
作者：
Awana, Geet;Cox, Chris;Backes, Dirk
在过去的几十年里，薄膜CoFeb的出现推动了研究和工业应用，其中最突出的例子是磁随机存取存储器(MRAM)。由于其有益的性质，它在磁隧道结中实现了信息存储、自旋过滤和参考层等多种功能。未来，这种多功能性可以通过与氧化物材料等先进材料相结合，在自旋电子学的传统应用之外得到开发。脉冲激光沉积(PLD)是它们的主要生长方法，因此这里将测试CoFeB与这种生长技术的兼容性。这包括对结构和磁性的全面研究。特别是，我们发现了一个实质性的‘死’磁层，并确认它是由利用x射线磁性圆二色(XMCD)效应的氧化引起的。基于矢量网络分析仪的铁磁共振(VNA-FMR)所遇到的低损耗使其适合于磁振子应用。这些发现表明，CoFeB薄膜与PLD生长的新兴材料兼容，确保了它们与未来应用的相关性。
The emergence of thin film CoFeB has driven research and industrial applications in the past decades, with the magnetic random access memory (MRAM) the most prominent example. Because of its beneficial properties, it fulfills multiple functionalities as information-storing, spin-filtering, and reference layer in magnetic tunnel junctions. In future, this versatility can be exploited beyond the traditional applications of spintronics by combining with advanced materials, such as oxide-based materials. Pulsed laser deposition (PLD) is their predominant growth-method, and thus the compatibility of CoFeB with this growth technique will be tested here. This encompasses a comprehensive investigation of the structural and magnetic propoperties. In particular, we find a substantial 'dead' magnetic layer and confirm that it is caused by oxidation employing the x-ray magnetic circular dichroism (XMCD) effect. The low damping encountered in vector network analyzer-based ferromagnetic resonance (VNA-FMR) renders them suitable for magnonics applications. These findings demonstrate that CoFeB thin films are compatible with emergent, PLD-grown materials, ensuring their relevance for future applications.