Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images
Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images
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DOI：
10.1088/0957-4484/27/36/364001
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发表时间：
2016-08
期刊：
影响因子：
3.5
通讯作者：
A. Yankovich;Chenyu Zhang;Albert K. Oh;T. Slater;F. Azough;R. Freer;S. Haigh;Rebecca M Willett
中科院分区：
文献类型：
--
作者：
A. Yankovich;Chenyu Zhang;Albert K. Oh;T. Slater;F. Azough;R. Freer;S. Haigh;Rebecca M Willett
图像配准和非局部泊松主成分分析（PCA）去噪提高了扫描透射电子显微镜下ca稳定Nd2/3TiO3原子分辨率特征x射线（EDS）成像质量。基于同时获取的高角度环形暗场图像的图像配准明显优于使用参考图像进行长像素停留时间或漂移校正的图像配准。非局部泊松PCA去噪比传统加权PCA去噪更强，同时更忠实地保留原子结构。通过对幻影数据的测试，评估了EDS光谱图像非局部泊松PCA去噪的可靠性和最优内部参数。
Image registration and non-local Poisson principal component analysis (PCA) denoising improve the quality of characteristic x-ray (EDS) spectrum imaging of Ca-stabilized Nd2/3TiO3 acquired at atomic resolution in a scanning transmission electron microscope. Image registration based on the simultaneously acquired high angle annular dark field image significantly outperforms acquisition with a long pixel dwell time or drift correction using a reference image. Non-local Poisson PCA denoising reduces noise more strongly than conventional weighted PCA while preserving atomic structure more faithfully. The reliability of and optimal internal parameters for non-local Poisson PCA denoising of EDS spectrum images is assessed using tests on phantom data.