Detecting the Existence of Malfunctions in Microcontrollers Utilizing Power Analysis
Detecting the Existence of Malfunctions in Microcontrollers Utilizing Power Analysis
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DOI：
10.1109/iolts.2018.8474113
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发表时间：
2018-07
期刊：
影响因子：
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通讯作者：
Kento Hasegawa;M. Yanagisawa;N. Togawa
中科院分区：
文献类型：
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作者：
Kento Hasegawa;M. Yanagisawa;N. Togawa
微控制器广泛应用于智能手机、电视和其他智能IoT（物联网）设备等电子设备。由于这些智能物联网设备的增加，硬件设备的安全性成为一个严重的问题。在本文中，我们提出了一种利用功耗分析来检测微控制器中是否存在故障的方法。我们的方法首先测量目标设备的功耗，并将其波形分为休眠模式部分，其中微控制器节省功耗，以及活动模式部分，其中微控制器正常工作。然后，我们将重点放在主动模式部分，从波形中提取若干特征，有效区分正常运行和故障。最后对特征进行分类，判断故障是否存在。实验结果表明，所提出的方法能够成功地检测出基准测试中存在的故障。
Microcontrollers are widely used in electric devices such as smart phones, televisions, and other smart IoT (Internet-of-Things) devices. Because of the increase of these smart IoT devices, the security of hardware devices becomes a serious concern. In this paper, we propose a method which detects the existence of malfunctions implemented in microcontrollers utilizing power analysis. Our method firstly measures power consumption of the target device and classifies its waveform into the sleep-mode part, in which a microcontroller saves power, and the active-mode part, in which a microcontroller works in a normal operation. After that, we focus on the active-mode part and extract several features from the waveform, which effectively distinguish between normal operations and malfunctions. Finally, we classify the features and identify whether malfunctions exist or not. Our experimental results demonstrate that our proposed method successfully detects the existence of malfunctions in our benchmark.