Application of fast atom bombardment (FAB) for ion microscopy of a rock sample
Application of fast atom bombardment (FAB) for ion microscopy of a rock sample
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快原子轰击（FAB）在岩石样品离子显微镜中的应用
DOI：
10.1002/sia.740150502
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发表时间：
1990
期刊：
影响因子：
--
通讯作者：
M. Sōma
中科院分区：
文献类型：
--
作者：
H. Seyama;M. Sōma
对CAMECA IMS4f离子显微镜进行了改装，以适应快原子轰击（FAB）源，并用于分析岩石样品（花岗闪长岩）的薄切片。与使用一次离子束的常规西姆斯相比，通过使用FAB源的西姆斯容易获得导电性差的材料（例如地质样品）的二次离子图像和质谱，其中借助于放置在样品表面上的铜网格容易避免充电效应。利用O_2FAB源获得的正二次离子图像和质谱图揭示了花岗闪长岩样品中黑云母和长石相元素分布的差异。23 Na+和39 K+离子图像清楚地表明钾钠长石在结晶过程中发生了分离。
A CAMECA IMS4f ion microscope was modified to accommodate a fast atom bombardment (FAB) source and used for the analysis of the thin section of a rock sample (granodiorite). In contrast to conventional SIMS using a primary ion beam, it is easy to obtain secondary ion images and mass spectra of poorly conducting material, such as geological samples, by SIMS using a FAB source where the charging effect is easily avoided with the aid of a copper grid placed on the sample surface. The difference of elemental distribution between biotite and feldspar phases in the granodiorite sample was revealed in the positive secondary ion images and mass spectra obtained by use of an O2FAB source. The images of23Na+and39K+ions clearly showed that the separation of potassium and sodium feldspars occurred in the process of feldspar crystallization.