Surface damage induced by FIB milling and imaging of biological samples is controllable
Surface damage induced by FIB milling and imaging of biological samples is controllable
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DOI：
10.1002/jemt.20494
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发表时间：
2007-10-01
影响因子：
2.5
通讯作者：
Tatti, Francesco
中科院分区：
文献类型：
--
作者：
Drobne, Damjana;Milani, Marziale;Tatti, Francesco
聚焦离子束（FIB）技术是用于表面纳米结构化的最重要的工具之一。我们使用FIB/SEM（扫描电子显微镜）对消化腺细胞进行研磨和成像。我们研究的目的是记录FIB调查期间FIB与生物样品表面的相互作用，以确定伪影的类别，并测试可以通过减少伪影来诱导FIB研磨切片质量的程序。制备消化腺细胞用于常规扫描电镜。在FIB/SEM操作过程中，我们诱导和增强伪影。结果表明，生物组织上的FIB操作影响了样品中离子束被光栅化的区域。我们描述了FIB引起的表面主要伪影为熔化样效应、发汗样效应、形态变形和镓（Ga+）注入。FIB引起的表面工件所造成的入射Ga+离子减少了由暴露于光束的表面上的保护铂条的应用程序，并通过适当的选择操作协议。我们建议将相同的样品制备方法、用于研磨和成像的FIB方案也用于其他生物样品。
Focused ion beam (FIB) techniques are among the most important tools for the nanostructuring of surfaces. We used the FIB/SEM (scanning electron microscope) for milling and imaging of digestive gland cells. The aim of our study was to document the interactions of FIB with the surface of the biological sample during FIB investigation, to identify the classes of artifacts, and to test procedures that could induce the quality of FIB milled sections by reducing the artifacts. The digestive gland cells were prepared for conventional SEM. During FIB/SEM operation we induced and enhanced artifacts. The results show that FIB operation on biological tissue affected the area of the sample where ion beam was rastering. We describe the FIB-induced surface major artifacts as a melting-like effect, sweating-like effect, morphological deformations, and gallium (Ga+) implantation. The FIB induced surface artifacts caused by incident Ga+ ions were reduced by the application of a protective platinum strip on the surface exposed to the beam and by a suitable selection of operation protocol. We recommend the same sample preparation methods, FIB protocol for milling and imaging to be used also for other biological samples.