Nondestructive investigation of damage in composites using x-ray tomographic microscopy (XTM)
Nondestructive investigation of damage in composites using x-ray tomographic microscopy (XTM)
复制标题
使用 X 射线断层扫描显微镜 (XTM) 对复合材料损伤进行无损研究
DOI：
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发表时间：
1990
期刊：
影响因子：
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通讯作者：
S. Antolovich
中科院分区：
文献类型：
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作者：
J. Kinney;S. Stock;M. C. Nichols;U. Bonse;T. Breunig;R. Saroyan;R. Nusshardt;Q. Johnson;F. Busch;S. Antolovich
X射线层析显微镜（XTM），利用强烈的，高度准直的同步辐射，已被用来无损图像的材料结构的三维。该技术的空间分辨率接近传统的光学显微镜，但XTM不需要抛光表面或连续切片。我们提出了一种复合材料组成的碳化硅纤维在铝基体的XTM调查的结果。结果揭示了铝/碳化硅界面，并显示出沿沿着许多界面以及在基体中的微裂纹。在围绕石墨芯的纤维的碳化硅鞘层和纤维-基体界面处的涂层之间观察到极好的对比度。对线性吸收系数的微小变化的灵敏度允许对石墨和碳化硅之间以及碳化硅和铝之间的化学变化进行无损成像。这些阶段的吸收系数的实验确定的值是相同的文献中公布的值。XTM将首次允许在变形测试期间观察损伤累积和裂纹扩展。这些数据的可用性将大大提高我们对先进材料失效的理解。
X-ray tomographic microscopy (XTM), utilizing intense, highly collimated synchrotron radiation, has been used to nondestructively image materials structures in three dimensions. The spatial resolution of the technique approaches that of conventional optical microscopy, but XTM does not require polished surfaces or serial sections. We present the results of an XTM investigation of a composite material composed of silicon-carbide fibers in an aluminum matrix. The results reveal the aluminum/silicon-carbide interfaces and show microcracks running along many of the interfaces as well as in the matrix. Excellent contrast is observed between the silicon-carbide sheath of the fiber surrounding the graphite core and the coating at the fiber-matrix interface. The sensitivity to small changes in the linear absorption coefficient allows nondestructive imaging of variations in chemistry between graphite and silicon carbide and between silicon carbide and aluminum. The experimentally determined values of the absorption coefficients of these phases are identical to values published in the literature. For the first time, XTM will allow observation of damage accumulation and crack growth during deformation testing. The availability of such data will greatly improve our understanding of failure in advanced materials.