Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices.
Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices.
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DOI：
10.1038/s41467-018-04662-2
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发表时间：
2018-06-08
影响因子：
16.6
通讯作者：
Muskens OL
中科院分区：
文献类型：
--
作者：
Vynck K;Dinsdale NJ;Chen B;Bruck R;Khokhar AZ;Reynolds SA;Crudgington L;Thomson DJ;Reed GT;Lalanne P;Muskens OL
先进的光子探测技术对于发展光子芯片的非接触式晶圆测试具有重要意义。超快光电调制已被确定为一种强大的新工具，能够通过扫描摄动远程测绘光子器件。在这里，我们通过基于洛伦兹互易的一般和严格的方法将光电调制图发展成一种定量技术，该方法允许以极高的精度和最小的计算成本预测任意线性光子系统的透射率摄动图。在各种光学多模干涉器件的预测图和实验图之间获得了极好的一致性，从而允许将被测器件与理想设计结构的物理模型进行直接比较。超快摄动映射不仅为光子制造中的光学测试提供了一条有前途的途径，还可用于具有可重构功能的光子结构的设计优化。先进的光子探针对于光子芯片的非接触式测试具有重要意义。在这里，Vynck等人开发了一种基于超快微扰透射率变化映射的定量技术来分析任意线性多端口光子器件。
Advanced photonic probing techniques are of great importance for the development of non-contact wafer-scale testing of photonic chips. Ultrafast photomodulation has been identified as a powerful new tool capable of remotely mapping photonic devices through a scanning perturbation. Here, we develop photomodulation maps into a quantitative technique through a general and rigorous method based on Lorentz reciprocity that allows the prediction of transmittance perturbation maps for arbitrary linear photonic systems with great accuracy and minimal computational cost. Excellent agreement is obtained between predicted and experimental maps of various optical multimode-interference devices, thereby allowing direct comparison of a device under test with a physical model of an ideal design structure. In addition to constituting a promising route for optical testing in photonics manufacturing, ultrafast perturbation mapping may be used for design optimization of photonic structures with reconfigurable functionalities. Advanced photonic probes are important for the development of non-contact wafer-scale testing of photonic chips. Here, Vynck et al. develop a quantitative technique based on mapping of transmittance variations by ultrafast perturbations to analyze arbitrary linear multi-port photonic devices.
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