Observation of positron trapping in nickel vacancies in single-crystal nickel oxide
Observation of positron trapping in nickel vacancies in single-crystal nickel oxide
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DOI：
10.1080/09500838908206465
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发表时间：
1989-12
影响因子：
1.2
通讯作者：
S. Creamer;P. Rice-Evans;A. Hughes;C. F. Coleman
中科院分区：
文献类型：
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作者：
S. Creamer;P. Rice-Evans;A. Hughes;C. F. Coleman
摘要正电子寿命谱被用来观察用过量非化学计量比氧制备的单晶氧化镍中正电子的捕获。两个寿命组件解决;较长的寿命和其强度被解释为由于本地化的正电子在镍空位。由计算结果得到的正电子体寿命为150 ps，与理论计算值符合较好。
Abstract Positron lifetime spectroscopy has been used to observe trapping of positrons in single-crystal NiO prepared with excess non-stoichiometry of oxygen. Two lifetime components are resolved; the longer lifetime and its intensity are interpreted as due to localisation of positrons in nickel vacancies. The positron bulk lifetime deduced from the results is 150ps and is in good agreement with theoretical calculations.