Tapping mode atomic force microscopy for nanoparticle sizing: Tip-sample interaction effects
Tapping mode atomic force microscopy for nanoparticle sizing: Tip-sample interaction effects
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DOI：
10.1021/nl025673p
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发表时间：
2002-09-01
期刊：
影响因子：
10.8
通讯作者：
Banin, U
中科院分区：
文献类型：
--
作者：
Ebenstein, Y;Nahum, E;Banin, U
使用轻敲模式原子力显微镜作为纳米粒子的尺寸测量工具进行了研究。发现在不同衬底上测量的CdSe纳米晶体的高度显著低于通过透射电子显微镜测定的粒径。只有轻微的高度变化，发现粒子表面配体交换后，但显着的高度变化，发现不同的化学性质的表面上成像的粒子。失真的高度数据归因于尖端共振频率在成像过程中的移位，由基底附近的吸引毛细管力引起。使用不同的驱动频率的悬臂梁时观察到的颗粒高度的变化证实了这一分配。
The use of tapping mode atomic force microscopy as a sizing tool for nanoparticles is investigated. Height of CdSe nanocrystals measured on different substrates is found to be significantly lower than the particle diameters as determined by transmission electron microscopy. Only minor height variations were found upon particle surface ligand exchange, but significant height variations were found for particles imaged on surfaces with different chemical natures. The distorted height data is attributed to shifts of the tip resonance frequency during imaging, induced by the attractive capillary forces near the substrate. Particle height variations observed when using different drive frequencies of the cantilever corroborate this assignment.