Verifying the RTE model: ortho‐positronium lifetime measurement on controlled pore glasses
Verifying the RTE model: ortho‐positronium lifetime measurement on controlled pore glasses
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验证 RTE 模型：控制孔径玻璃上的正正电子寿命测量
DOI：
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发表时间：
2007
期刊：
影响因子：
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通讯作者：
R. Krause
中科院分区：
文献类型：
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作者：
S. Thränert;E. M. Hassan;D. Enke;D. Fuerst;R. Krause
在多孔介质中，正电子偶素（o-Ps）的真空寿命τ = 142 ns，由于拾取湮没（与主体材料的电子相互作用）而显著降低。因此，o-Ps寿命由孔径确定，所述孔径可以通过利用批准的模型来提取，所述批准的模型如用于小于lnm的孔径的Tao-Eldrup模型和用于较大孔径的Tokyo模型或RTE模型。RTE模型包含一个明确的温度依赖性的o-Ps寿命。在不同温度（50-500 K）下对不同孔径（2-70 nm）的可控孔玻璃（CPG）进行了实验，以验证RTE模型。在T = 300 K时，结果基本一致，但寿命与温度的关系，特别是低温下的寿命，不能得到充分的证实。（© 2007 WILEY-VCH Verlag GmbH & Co. KGaA，魏因海姆）
In porous media, the vacuum lifetime of ortho-positronium (o-Ps) of τ = 142 ns can be reduced markedly by pick-off annihilation (interaction with electrons of the host material). So the o-Ps lifetime is determined by the pore size which can be extracted by utilising approved models like the Tao-Eldrup model for pore sizes smaller than 1 nm and the Tokyo model or RTE model for larger pore sizes. The RTE model contains an explicit temperature dependence of the o-Ps lifetime. Experiments on controlled pore glasses (CPG) with different pore sizes (2-70 nm) at different temperatures (50-500 K) were performed to verify the RTE model. A general agreement for T = 300 K could be found. The temperature dependence of the lifetime, especially for low temperatures, could not be approved sufficiently. (© 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)