Determination of the saturation magnetization of ion irradiated Py/Ta samples using polar magneto-optical Kerr effect and ferromagnetic resonance
Determination of the saturation magnetization of ion irradiated Py/Ta samples using polar magneto-optical Kerr effect and ferromagnetic resonance
复制标题
利用极磁光克尔效应和铁磁共振测定离子辐照 Py/Ta 样品的饱和磁化强度
DOI：
10.1063/1.3291051
复制
发表时间：
2010
影响因子：
4
通讯作者：
R. Kaltofen
中科院分区：
文献类型：
--
作者：
D. Markó;T. Strache;K. Lenz;J. Fassbender;R. Kaltofen
基于极磁光克尔效应和频率相关的铁磁共振测量，已经发现了一种方法，允许定量测定样品的饱和磁化强度与未知的有效磁体积。常规的磁力测量法不能用于此目的。薄Py/Ta多层膜的总Py厚度为20 nm，但不同数量的接口被用作测试系统。通过Ne离子辐照，由于界面混合，磁矩和饱和磁化强度受到影响。随着离子注量的增加和Py/Ta界面数目的增加，观察到饱和磁化强度降低。
Based on polar magneto-optical Kerr effect and frequency dependent ferromagnetic resonance measurements, a method has been found that allows for the quantitative determination of the saturation magnetization of samples with unknown effective magnetic volume. Conventional magnetometry cannot be used for this purpose. Thin Py/Ta multilayers with an overall Py thickness of 20 nm but different number of interfaces are used as test systems. By means of Ne ion irradiation the magnetic moment and the saturation magnetization are affected due to interfacial mixing. With both increasing ion fluence and increasing number of Py/Ta interfaces, a decrease of saturation magnetization is observed.