MICELLAR PROPERTIES OF SOME ZWITTERIONIC SURFACTANTS
MICELLAR PROPERTIES OF SOME ZWITTERIONIC SURFACTANTS
复制标题
DOI：
10.1016/0021-9797(66)90015-4
复制
发表时间：
1966-01-01
影响因子：
9.9
通讯作者：
HERRMANN, KW
中科院分区：
文献类型：
--
作者：
HERRMANN, KW
用光散射技术测定了几种两性离子表面活性剂的临界胶束浓度（CMC）和胶束分子量（MMW）。研究了两性离子表面活性剂R+ X （R′）2R″Y−分子结构的变化，并根据现有的胶束形成理论讨论了这种结构变化所引起的胶束性质的变化。所有两性离子表面活性剂给出的Hc τ vs. c图斜率为零，从而表明它们在稀水溶液中表现理想。同源系列表面活性剂的[C n H 2 n + 1+ n (CH 3) 2 (CH 2) 3 3−),其中n = 10, 12日,16日,一块日志CMC与n减小线性增加的价值给的标准偏摩尔自由能的变化每CH 2群−1.03沿胶束形成的胶束性质比较非离子、两性离子,离子表面活性剂表明,(1)添加电解质的影响(氯化钠)中央军委的顺序和毫米波减少离子>两性离子>非离子;(2)当表面活性剂的烷基基团大于c10h21时，非离子>、两性离子>等离子型胶束更容易形成。
The critical micelle concentration (CMC) and micelle molecular weight (MMW) of a number of zwitterionic surfactants have been determined using light-scattering techniques. Variations in the molecular structure of a zwitterionic surfactant, R+ X (R′) 2 R ″ Y−, were made, and the changes in the micellar properties resulting from these structural variations are discussed in the light of existing theory of micelle formation. All the zwitterionic surfactants give Hc τ vs. c plots which have zero slopes, thus indicating they behave ideally in dilute aqueous solutions. For a homologous series of surfactants [C n H 2n+ 1+ N (CH 3) 2 (CH 2) 3 SO 3−], where n= 10, 12, 16, a plot of log CMC vs. n decreases linearly with increased n value giving a change in the standard partial molal free energy of micelle formation per CH 2 group of− 1.03 RT. Comparison of the micellar properties of nonionic, zwitterionic, and ionic surfactants shows that (1) the effect of added electrolyte (NaCl) on the CMC and MMW decreases in the order ionic> zwitterionic> nonionic; and (2) micelles form more easily in the order nonionic> zwitterionic> ionic when the alkyl group of the surfactant is larger than C 10 H 21.