Atomic-Scale Structural Analysis on the Interfaces between Molten Gallium and Solid Alloys by Atomic Force Microscopy
Atomic-Scale Structural Analysis on the Interfaces between Molten Gallium and Solid Alloys by Atomic Force Microscopy
复制标题
DOI：
10.1021/acs.jpcc.1c08029
复制
发表时间：
2021-12-02
影响因子：
3.7
通讯作者：
Sugimura, Hiroyuki
中科院分区：
文献类型：
--
作者：
Ichii, Takashi;Murata, Makoto;Sugimura, Hiroyuki
原子力显微镜（AFM）是一种在原子尺度上表征固/液界面结构的强大技术。然而，使用Si杠杆的常规AFM只能应用于光学透明的液体。在这项研究中，我们应用石英音叉传感器来克服这个问题，并成功地在熔融镓和固体Au-Ga合金之间的界面结构的AFM成像。根据原子分辨率成像结果，合金的晶体结构被确定为AuGa 2，并且还发现AuGa 2（111）表面暴露。对合金晶体生长过程进行了原位观察，并对其生长模式进行了探讨。我们还发现，熔融Ga的界面溶剂化结构可以被可视化，这对应于固体AuGa 2的原子排列。由于熔融和固体金属界面在许多冶金应用（例如电镀、软焊和硬焊）中发挥着至关重要的作用，因此在原子尺度上表征这些界面对于科学和实用目的都非常重要。这项研究表明，原子力显微镜作为一种新的分析技术的熔融和固体金属界面的潜力。
Atomic force microscopy (AFM) is a powerful technique to characterize solid/liquid interfacial structures on an atomic scale. However, conventional AFM using Si cantilevers can only be applied to optically transparent liquids. In this study, we applied a quartz tuning fork sensor to overcome this issue and succeeded in AFM imaging of the interfacial structures between molten Ga and solid Au-Ga alloys. The crystal structure of the alloy was identified as AuGa2 from the atomic-resolution imaging results, and the AuGa2 (111) surfaces were also found to be exposed. In situ observation of the alloy crystal growth was carried out, and its growth mode was discussed. We also found that the interfacial solvation structure of molten Ga can be visualized, which corresponded well to the atomic arrangement of the solid AuGa2. Since the molten- and solid-metal interfaces play crucial roles in many metallurgy applications, such as plating, soldering, and brazing, it is of great importance for both scientific and practical purposes to characterize these interfaces at the atomic scale. This study demonstrates the potential of AFM as a new analytical technique of molten- and solid-metal interfaces.