Critical-current measurements in epitaxial films of YBa2Cu
Critical-current measurements in epitaxial films of YBa2Cu
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DOI：
10.1103/physrevlett.58.2684
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发表时间：
1987-06
影响因子：
8.6
通讯作者：
P. Chaudhari;R. Koch;R. Laibowitz;T. Mcguire;R. Gambino
中科院分区：
文献类型：
--
作者：
P. Chaudhari;R. Koch;R. Laibowitz;T. Mcguire;R. Gambino
我们在${\mathrm{SrTiO}}_{3}$衬底上生长了${\mathrm{YBa}}_{2}$${\mathrm{Cu}}_{3}$${\mathrm{O}}_{7\mathrm{\ensuremath{-}}\mathrm{x}}$化合物的外延膜。这些薄膜在77 K时的超导临界电流超过${10}^{5}$ A/ ${\mathrm{cm}}^{2}$，在4.2 K时的超导临界电流超过${10}^{6}$ A/ ${\mathrm{cm}}^{2}$。
We have grown epitaxial films of the ${\mathrm{YBa}}_{2}$${\mathrm{Cu}}_{3}$${\mathrm{O}}_{7\mathrm{\ensuremath{-}}\mathrm{x}}$ compound on ${\mathrm{SrTiO}}_{3}$ substrates. The superconducting critical current in these films at 77 K is in excess of ${10}^{5}$ A/${\mathrm{cm}}^{2}$ and at 4.2 K in excess of ${10}^{6}$ A/${\mathrm{cm}}^{2}$.