Detecting dynamic responses of materials and devices under an alternating electric potential by phase-locked transmission electron microscopy
Detecting dynamic responses of materials and devices under an alternating electric potential by phase-locked transmission electron microscopy
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DOI：
10.1016/j.ultramic.2017.04.018
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发表时间：
2017-10-01
期刊：
影响因子：
2.2
通讯作者：
Takeda, Seiji
中科院分区：
文献类型：
--
作者：
Soma, Kentaro;Konings, Stan;Takeda, Seiji
开发了一种用于透射电子显微镜（TEM）的装置，以获取图像和光谱数据，例如TEM图像、电子全息图和电子能量损失谱，与在施加的交流（AC）电势（电压，表示为V-Ac）下的样品的动态响应的测量同步。根据频率f的V-Ac，产生快门脉冲信号，以打开和关闭基本TEM装置中的预试样快门。每个VAc周期产生从目标相位Phi到Phi + Δ Phi的脉冲，其中相位宽度Δ Phi（Δ Phi < 2 π）。Δ Φ对应于时间脉冲宽度τ（τ
An apparatus is developed for transmission electron microscopy (TEM) to acquire image and spectral data, such as TEM images, electron holograms, and electron energy loss spectra, synchronized with the measurement of the dynamic response of a specimen under an applied alternating current (AC) electric potential (voltage, denoted V-Ac). From a V-Ac of frequency f, a shutter pulse signal is generated to open and close a pre-specimen shutter in a base TEM apparatus. A pulse is generated per VAc cycle from the targeted phase Phi to Phi + Delta Phi with phase width Delta Phi (Delta Phi < 2 pi). Delta Phi corresponds to the temporal pulse width tau (tau