ATTENUATION LENGTHS OF PHOTOELECTRONS IN HYDROCARBON FILMS
ATTENUATION LENGTHS OF PHOTOELECTRONS IN HYDROCARBON FILMS
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DOI：
10.1021/j100341a095
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发表时间：
1989-02-23
影响因子：
--
通讯作者：
WHITESIDES, GM
中科院分区：
文献类型：
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作者：
BAIN, CD;WHITESIDES, GM
使用在金上的烷硫醇HSCnH 2n + 1的自组装单分子膜，测量烃膜中能量在900-1400 eV范围内的光电子的衰减长度。金衬底上的光电子峰强度随链长的增加呈指数衰减，在1402 eV处衰减42 Ω，在1151 eV处衰减34 Ω，在940 eV处衰减28 Ω。在所研究的窄能量范围内，X与光电子的动能成正比。通过X射线光电子能谱（XPS）获得的数据的定量分析需要知道电子从样品表面的逃逸深度。为了从来自不同元素的光电子的强度导出均匀材料的组成，不仅需要知道相对原子截面，而且需要知道衰减长度X随光电子能量的变化。2推导元素深度剖面的能力
The attenuation length,, of photoelectrons with energies in the range 900-1400 eV in hydrocarbon films was measured using self-assembled monolayers of alkanethiols, HSC „H2 „+ 1, on gold. The intensityof the photoelectron peaks from the gold substrate decreased exponentiallywith the chain length, with attenuation lengths of 42 Á at 1402 eV, 34 Á at 1151 eV, and 28 Á at 940 eV. Over the narrow energy range studied, X was directly proportional to the kinetic energy of the photoelectrons.Quantitative analysis of data obtained by X-ray photoelectron spectroscopy (XPS) requires a knowledge of the escape depths of electrons from the surface of a sample. 1 In order to derive the composition of a homogeneous material from the intensities of the photoelectrons originating from different elements, one needs to know not only the relative atomic cross sections but also the variation of the attenuation length X with the energy of the photoelectrons. 2 The ability to derive an elemental depth profile