Ex‐Situ Stress Measurements in Polycrystalline Ceramics Using Photo‐Stimulated Luminescence Spectroscopy and High‐Energy X‐Rays
Ex‐Situ Stress Measurements in Polycrystalline Ceramics Using Photo‐Stimulated Luminescence Spectroscopy and High‐Energy X‐Rays
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使用光受激发光光谱和高能 X 射线测量多晶陶瓷的异位应力
DOI：
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发表时间：
2009
期刊：
影响因子：
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通讯作者：
P. Imbrie
中科院分区：
文献类型：
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作者：
S. Raghavan;P. Imbrie
光激发发光光谱（PSLS）技术为确定多晶氧化铝中众所周知的R线峰位的应力依赖性提供了方法。本文介绍的单轴压缩试验确定了描述这种光弹光谱（PS）行为的系数，涉及两个此前未探索的领域。首先，本文引入了发射光谱中的电子振动带峰，并确定了这些带内几个峰的PS系数。这些结果为利用电子振动带峰移以及R线来提供应力张量的非对称分量，从而测量多晶氧化铝中的完整应力状态奠定了基础。其次，高能X射线作为一种非原位应力测量方法，是光学荧光位移的基础，从而以一种独特的方法提高了PS系数确定的准确性。本文介绍了PSLS和同步辐射X射线实验的结果，并将其结合使用，以揭示多晶氧化铝PS行为的新信息。
The photo-stimulated luminescence spectroscopy (PSLS) technique provides the means to establish stress dependencies of the well-known R-line peak positions in polycrystalline alumina. The uniaxial compression tests presented in this paper, which determine the coefficients describing this piezospectroscopic (PS) behavior, tackle two previously unexplored areas. Firstly, the vibronic band peaks in the emission spectrum are introduced here, and the PS coefficients of several peaks within these bands are established. These results set the foundation for the exploitation of vibronic band peakshifts, along with the R-lines, in order to provide the non-symmetric components of the stress tensor and therefore the measurement of the complete stress state in polycrystalline alumina. Secondly, high-energy X-rays serve as an ex-situ stress measurement method upon which the optical fluorescence shifts are based, thereby advancing the accuracy of PS coefficient determination in a unique approach. The results of PSLS and synchrotron X-ray experiments are presented here and used in conjunction to reveal new information on the PS behavior of polycrystalline alumina.