Microtechnology, nanotechnology, and the scanning-probe microscope: an innovative course
Microtechnology, nanotechnology, and the scanning-probe microscope: an innovative course
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微技术、纳米技术和扫描探针显微镜：一门创新课程
DOI：
10.1109/te.2003.817623
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发表时间：
2004
影响因子：
2.6
通讯作者：
L. Leifer
中科院分区：
文献类型：
--
作者：
Jesse D. Adams;B. Rogers;L. Leifer
内华达大学里诺分校与加州斯坦福大学联合为本科生和研究生开发了一门创新的微技术/纳米技术/扫描探针显微镜（SPM）课程。在斯坦福大学进行的两年SPM技术研究在研究结果完成和发表之前被转移到课堂上。该课程被映射到Kolb学习周期，受到学生的好评，并作为SPM锚定的有效、创新和高度相关的小系统课程的例子。
An innovative combined microtechnology/nanotechnology/scanning-probe microscope (SPM) course for undergraduate and graduate students has been developed at the University of Nevada, Reno, in conjunction with Stanford University, Stanford, CA. Two years of technical SPM research carried out at Stanford University was transferred to the classroom before the results of the research were completed and published. The course, which was mapped to the Kolb learning cycle, was well received by students and serves as an example of an effective, innovative, and highly pertinent small-systems course anchored by the SPM.