Time-Dependent Multiphoton Ionization of Xenon in the Soft-X-Ray Regime
Time-Dependent Multiphoton Ionization of Xenon in the Soft-X-Ray Regime
复制标题
DOI：
10.1103/physrevlett.112.213002
复制
发表时间：
2014-05-30
影响因子：
8.6
通讯作者：
Martins, M.
中科院分区：
文献类型：
--
作者：
Gerken, N.;Klumpp, S.;Martins, M.
在光子能量为 93 eV 的 4d 巨共振激发范围内，使用飞秒脉冲研究了氙原子的时间依赖性多光子电离。受益于自由电子激光FLASH的新操作模式，可以使用不同的脉冲持续时间进行测量。离子电荷分布对脉冲持续时间的强烈依赖性使得氙的多重光电离背后的不同多光子机制能够解开直至 Xe10+ 的电荷态。单光子、多光子和俄歇过程的序列可以很好地解释高达 Xe8+ 的结果，但更高的电荷态生成表明需要集体电子多光子激发。
The time-dependent multiphoton ionization of xenon atoms is studied with femtosecond pulses in the excitation range of the 4d giant resonance at the photon energy of 93 eV. Benefiting from a new operation mode of the free electron laser FLASH, the measurements are performed with varying pulse durations. A strong dependence of the ion charge distribution on the pulse duration allows the different multiphoton mechanisms behind the multiple photoionization of xenon to be disentangled up to a charge state of Xe10+. The results up to Xe8+ are well explained by sequences of single photon, multiphoton, and Auger processes, but higher charge state generation suggests the need for collective electron multiphoton excitations.