On Extra Delays Affecting I/O Blocks of an SRAM-Based FPGA Due to Ionizing Radiation
On Extra Delays Affecting I/O Blocks of an SRAM-Based FPGA Due to Ionizing Radiation
复制标题
由于电离辐射而影响基于 SRAM 的 FPGA 的 I/O 块的额外延迟
DOI：
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发表时间：
2014
影响因子：
1.8
通讯作者：
Y. Audet
中科院分区：
文献类型：
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作者：
F. Z. Tazi;C. Thibeault;Y. Savaria;S. Pichette;Y. Audet
本文的目的是在静态随机存取存储器的现场可编程门阵列（SRAM为基础的FPGA）的输入/输出块（IOBs）的电离辐射引起的额外的延迟特性，使用基于环形振荡器（RO）的测量技术。该表征工作包括在TRIUMF对Xilinx器械（Virtex-5和阿蒂克斯-7）进行的质子辐照实验。从这些照射实验的结果表明，RO周期的变化，高达6.2 ns的Virtex-5和3.8 ns的阿蒂克斯-7，可以诱导。这些结果还表明，影响在IOB中实现的RO的事件（即延迟和中断）的发生率接近在FPGA内核中实现RO时观察到的速率，即使专用于IOB的配置位的数量显著低于FPGA内核。这些辐射测试实验通过使用类似的基于RO的测量技术和Xilinx SEU控制器作为故障注入器的仿真来支持。故障注入实验允许更好地理解由于配置位翻转而受到额外延迟影响的IOB的行为，在许多情况下，这类似于在不正确的参数设置下可以观察到的行为。仿真实验还表明，许多事件修改IOB的行为被发现需要多位故障注入。
This paper aims at characterizing additional delays induced by ionizing radiation in Input/Output Blocks (IOBs) of Static Random-Access Memory Based Field Programmable Gate Arrays (SRAM-Based FPGAs), using measurement techniques based on ring oscillators (ROs). This characterization effort includes experiments performed with proton irradiation at TRIUMF on Xilinx devices (Virtex-5 and Artix-7). Results from these irradiation experiments show that RO period variations, up to 6.2 ns for Virtex-5 and 3.8 ns for Artix-7, could be induced. These results also reveal that the occurrence rate of events (namely delays and breaks) affecting ROs implemented in IOBs is approaching the rate observed when ROs are implemented in the FPGA core, even if the number of configuration bits dedicated to IOBs is significantly lower than for the FPGA core. These radiation test experiments are supported by emulation using similar RO-based measurement techniques and Xilinx SEU Controller as a fault injector. The fault injection experiments allow a better understanding of the behaviour of IOBs affected by additional delays due to configuration bit flips, which in many cases is similar to what can be observed with an incorrect parameter setting. Emulation experiments also reveal that many of the events modifying IOB behaviour are found to require multiple bit fault injection.