Ferro- and piezoelectric properties of intergrowth Bi 4Ti3O12–BaBi4Ti4O15 thin flm

Ferro- and piezoelectric properties of intergrowth Bi 4Ti3O12–BaBi4Ti4O15 thin flm
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共生 Bi 4Ti3O12−BaBi4Ti4O15 薄膜的铁电性能和压电性能

DOI:
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发表时间:
2017
期刊:
J Mater Sci: Mater Electron
影响因子:
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通讯作者:
G. D. Hu
G. D. Hu
中科院分区:
其他
文献类型:
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作者:
J. Yan;G. D. Hu

文献摘要

相似文献

采用溶胶-凝胶法在 Pt (111)/Ti/SiO2/Si 基底上沉积 Bi.4Ti3O12–BaBi4Ti4O15 (BT–BBTi) 薄膜。根据 X 射线衍射图谱,BT-BBTi 薄膜和源自相同涂层溶液的粉末样品均具有共生结构。 BT-BBTi薄膜的剩余极化强度高达20 μC/cm2,比BBTi (∼15 μC/cm2)沿轴的剩余极化强度高出约30%。根据使用原子力显微镜在压电响应模式下进行的压电测量,预测均匀结晶 a 轴取向 BT-BBTi 薄膜的 Pr 值应大于 40 μC/cm2。 BT-BBTi flm. 在 109 个开关周期后表现出良好的抗疲劳性。
Bi.4Ti3O12–BaBi4Ti4O15 (BT–BBTi) thin flm.was deposited on Pt (111)/Ti/SiO2/Si substrate using the.sol–gel method. Both BT–BBTi flm and the powder sample.derived from the same coating solution were demonstrated.to possess an intergrowth structure according to X-ray diffraction patterns. The remanent polarization for BT–BBTi.thin flm was as large as 20 μC/cm2, which is about 30%.higher than that of BBTi (∼15 μC/cm2) along a axis. The.predicted Pr value for uniformly crystallized a-axis-oriented.BT–BBTi flm should be larger than 40 μC/cm2 according.to the piezoelectric measurements using an atomic force.microscope in the piezoresponse mode. The BT–BBTi flm.exhibited good fatigue resistance after 109 switching cycles.