THE EFFECT OF SR AND BI ON THE SI(100) SURFACE OXIDATION - AUGER-ELECTRON SPECTROSCOPY, LOW-ENERGY ELECTRON-DIFFRACTION, AND X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY
THE EFFECT OF SR AND BI ON THE SI(100) SURFACE OXIDATION - AUGER-ELECTRON SPECTROSCOPY, LOW-ENERGY ELECTRON-DIFFRACTION, AND X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY
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DOI:
10.1116/1.576438
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发表时间:
1990-11-01
期刊:
影响因子:
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通讯作者:
IGNATIEV, A
中科院分区:
文献类型:
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作者:
FAN, WC;MESARWI, A;IGNATIEV, A