Superconducting niobium titanium nitride thin films deposited by plasma-enhanced atomic layer deposition
Superconducting niobium titanium nitride thin films deposited by plasma-enhanced atomic layer deposition
复制标题
等离子体增强原子层沉积超导铌钛氮化物薄膜
DOI:
10.1088/1361-6668/aa7ce3
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发表时间:
2017
影响因子:
3.6
通讯作者:
J. Provine
中科院分区:
文献类型:
--
作者:
Y. Yemane;M. Sowa;J. Zhang;L. Ju;E. Deguns;N. Strandwitz;F. Prinz;J. Provine
NbTiN has a variety of superconducting applications, ranging from RF cavities to single-photon detectors. Here, we systematically investigated the plasma-enhanced atomic layer deposition (PEALD) of NbxTi 1 − x N with the organometallic precursors (t-butylimido) tris(diethyamido) niobium(V) and tetrakis (dimethylamido) titanium in conjunction with a remote H2/N2 plasma. Deposited film properties have been studied as a function of the ratio of Nb to Ti precursor pulses within each ALD supercycle. PEALD NbTiN films were characterized with spectroscopic ellipsometry (thickness, optical properties), four point probe (resistivity), x-ray photoelectron spectroscopy (composition), x-ray reflectivity (density and thickness), x-ray diffraction (crystallinity), and superconductivity measurements. The PEALD process has shown distinct advantages over deposition of superconducting films via thermal ALD or sputtering, for example a lower processing temperature and more efficient control of film composition. This control of film composition enabled the tuning of electrical and superconducting properties, such as varying the superconducting critical temperature TC between 6.9 and 13.2 K.