Extreme sub-wavelength resolution with a scanning radio-frequency transmission microscope
Extreme sub-wavelength resolution with a scanning radio-frequency transmission microscope
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使用扫描射频透射显微镜获得极高的亚波长分辨率
DOI：
10.1016/0030-4018(96)00108-3
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发表时间：
1996
影响因子：
2.4
通讯作者：
D. Stöckle
中科院分区：
文献类型：
--
作者：
F. Keilmann;D. Weide;T. Eickelkamp;R. Merz;D. Stöckle
通过扫描两个同轴传输线尖端之间的金属网格样品，我们使用高达λ = 20 m的波长解析Δx <$10 μm的特征，在幅度和相位上都实现了波长相对分辨率Δx λ < 5 × 10− 7。作为一个例子，该技术的电导率对比显微镜的相当普遍的应用，我们测量的GaAs AlGaAs异质结构与磁场的局部透射率。我们认为这项工作是一个证明的原则实验，证明缩小同轴尖端几何形状的亚微米制度。
By scanning a metal grid sample between two coaxial transmission line tips, we resolve Δx ≈ 10 μm features using up to λ = 20 m wavelengths, achieving wavelength-relative resolution Δx λ < 5 × 10−7in both magnitude and phase. As an example of the technique's quite general application to conductivity-contrast microscopy, we measure the local transmittance of a GaAs AlGaAs heterostructure versus magnetic field. We view this work as a proof-of-principle experiment which justifies scaling down the coaxial tip geometry to the sub-micrometer regime.