Timing Jitter Measurement in Single-Flux-Quantum Circuits Based on Time-to-Digital Converters With High Time-Resolution
Timing Jitter Measurement in Single-Flux-Quantum Circuits Based on Time-to-Digital Converters With High Time-Resolution
复制标题
基于高时间分辨率时间数字转换器的单通量量子电路中的定时抖动测量
DOI:
10.1109/tasc.2007.898560
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发表时间:
2007
影响因子:
1.8
通讯作者:
A. Fujimaki
中科院分区:
文献类型:
--
作者:
M. Terabe;A. Sekiya;T. Yamada;A. Fujimaki
We evaluated timing jitter based on a time-to-digital converter (TDC) having sub-pico seconds time resolution. The measured jitter at liquid helium temperature was 65 fs for an optimally damped simple junction composing a conventional Josephson transmission line fabricated with the NEC standard process. The temperature dependence and shunt resistance dependence of jitter indicate that the jitter originates from thermal noise generated at the shunt resistor of the junction. We also found that the timing jitter of a balanced comparator is much larger than that of a JTL. The jitter of a balanced comparator is independent of temperature. This means that the jitter of a balanced comparator does not arise from thermal noise.