Nernst and Ettingshausen Effects in Silicon between 300°K and 800°K
Nernst and Ettingshausen Effects in Silicon between 300°K and 800°K
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DOI:
10.1103/physrev.117.1491
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发表时间:
1960-03
期刊:
影响因子:
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通讯作者:
H. Mette;W. Gärtner;C. Loscoe
中科院分区:
文献类型:
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作者:
H. Mette;W. Gärtner;C. Loscoe