Estimation of Small Geometry Deviation for TESLA-Shape Cavities Due to Inner Surface Polishing
Estimation of Small Geometry Deviation for TESLA-Shape Cavities Due to Inner Surface Polishing
复制标题
内表面抛光引起的 TESLA 形状腔体小几何偏差的估计
DOI：
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发表时间：
2013
期刊：
影响因子：
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通讯作者：
J.K.Sekutowicz
中科院分区：
文献类型：
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作者：
A. Sulimov;G.Kreps;J.K.Sekutowicz
两种众所周知的抛光方法用于超导TESLA形腔的内表面清洁[1]：电抛光（EP）或缓冲化学抛光（BCP）。去除的材料量相对较小，范围为5至140 μm。抛光后将腔体封闭，以防止其内表面出现划痕或灰尘。通过不同的标准，例如通过比较清洁前后的重量，或通过清洁过程持续时间，可以估计去除的材料量。两种计算都只能给出被去除材料量的近似平均值。我们描述了基于RF频率测量的小几何偏差的估计方法，该方法允许计算表面处理对虹膜和赤道区域的不同影响。
Two well-known polishing methods are used for the inner surface cleaning of superconducting TESLA-shape cavities [1]: electro-polishing (EP) or buffered chemical polishing (BCP). The amount of removed material is relatively small and varies from 5 till 140 μm. The cavity is closed after polishing to prevent scratches or dust appearing on its inner surface. The estimation of the removed material amount is possible by different criteria, for example by comparison of weight before and after cleaning, or by the time cleaning procedure duration. Both calculations could give us only approximate average value of the removed material amount. We describe the method for estimation of small geometry deviation basing on RF frequency measurements, which allows calculation of the different influence of surface treatment on the iris and equator areas.