Locally testable codes and PCPs of almost-linear length
Locally testable codes and PCPs of almost-linear length
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本地可测试的代码和几乎线性长度的 PCP
DOI:
10.1109/sfcs.2002.1181878
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发表时间:
2002
期刊:
影响因子:
--
通讯作者:
M. Sudan
中科院分区:
文献类型:
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作者:
Oded Goldreich;M. Sudan
Locally testable codes are error-correcting codes that admit very efficient codeword tests. Specifically, using a constant number of (random) queries, noncodewords are rejected with probability proportional to their distance from the code. Locally testable codes are believed to be the combinatorial core of PCPs. However, the relation is less immediate than commonly believed. Nevertheless, we show that certain PCP systems can be modified to yield locally testable codes. On the other hand, we adapt techniques we develop for the construction of the latter to yield new PCPs. Our main results are locally testable codes and PCPs of almost-linear length. Specifically, we present: 1. Locally testable (linear) codes in which k information bits are encoded by a codeword of length approximately k /spl middot/ exp(/spl radic/(log)). This improves over previous results that either yield codewords of exponential length or obtained almost quadratic length codewords for sufficiently large non-binary alphabet. 2. PCP systems of almost-linear length for SAT. The length of the proof is approximately n /spl middot/ exp(/spl radic/(log n)) and verification in performed by a constant number (i.e., 19) of queries, as opposed to previous results that used proof length n/sup 1+O(1/q)/ for verification by q queries. The novel techniques in use include a random projection of certain codewords and PCP-oracles, an adaptation of PCP constructions to obtain "linear PCP-oracles" for proving conjunctions of linear conditions, and a direct construction of locally testable (linear) codes of sub-exponential length.