The study of the defect removal etching of black silicon for diamond wire sawn multi-crystalline silicon solar cells
The study of the defect removal etching of black silicon for diamond wire sawn multi-crystalline silicon solar cells
复制标题
金刚线锯多晶硅太阳能电池黑硅缺陷去除刻蚀研究
DOI:
10.1016/j.solener.2018.04.066
复制
发表时间:
2018
期刊:
影响因子:
6.7
通讯作者:
Chen Bihua
中科院分区:
文献类型:
--
作者:
Su Guoyu;Dai Xiaowan;Tao Ke;Sun Hengchao;Jia Rui;Jin Zhi;Liu Xinyu;Liu Hongzhi;Liu Shouqiang;Xu Chun;Cao Yujia;Zhao Yan;Qu Hui;Liu Bin;Chen Bihua
We produced low-reflectivity nanostructured black silicon by metal-assisted chemical etching (MACE) technology on the 15.6 cm × 15.6 cm diamond wire sawn (DWS) multi-crystalline silicon (mc-Si) wafers. Subsequently, defect removal etching (DRE) processes were carried out for various times to form nanohills with different sizes on the wafer surface. The experimental results indicated that the DRE process could influence the size of the nanohills, reflectivity and the recombination velocities of the silicon wafers. It was found that for the black silicon wafer, with the increasing of DRE time, the reflectivity became larger and the passivation effect became better. The reflectivity and the passivation effect can be adjusted by suitable DRE processes. By this way, we successfully fabricated the DWS mc-Si solar cell (15.6 cm × 15.6 cm) with the highest conversion efficiency of 19.07%, showing an improvement in efficiency of 0.6% compared to a DWS mc-Si solar cell (15.6 cm × 15.6 cm) prepared by conventional acidic texturization.