Post-silicon power characterization using thermal infrared emissions
Post-silicon power characterization using thermal infrared emissions
复制标题
使用热红外发射进行硅后功率表征
DOI：
10.1145/1840845.1840914
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发表时间：
2010
期刊：
影响因子：
--
通讯作者：
S. Reda
中科院分区：
文献类型：
--
作者：
Ryan Cochran;Abdullah Nazma Nowroz;S. Reda
设计时功耗分析是芯片架构师和电路设计师执行的最关键的任务之一。虽然计算机辅助功耗分析工具可以提供各种电路块的功耗估计，但这些估计可能大大偏离工作硅芯片的实际功耗。我们提出了一种新颖的方法，该方法利用硅芯片背面的热红外发射来提供准确、详细的硅后空间功率估计。我们从理论上和经验上证明了热功率反演的固有困难。这些困难源于测量误差以及与热扩散相关的固有空间低通滤波。为了解决这些困难，我们提出了从正则化理论到将温度反转为功率的新技术。此外，我们提出了计算任何红外功率反演方法所需的发射率和电导的新技术。为了验证我们的结果，采用了微型加热器的可编程电路来创建任何所需的功率模式。使用最先进的红外相机捕获不同已知注入功率模式的热发射，然后应用我们的表征技术将热发射转化为功率。估计的功率模式根据注入的功率模式进行验证，以证明我们方法的准确性。
Design-time power analysis is one of the most critical tasks conducted by chip architects and circuit designers. While computer-aided power analysis tools can provide power consumption estimates for various circuit blocks, these estimates can substantially deviate from the actual power consumption of working silicon chips. We propose a novel methodology that provides accurate, detailed post-silicon spatial power estimates using the thermal infrared emissions from the backside of silicon die. We theoretically and empirically demonstrate the inherent difficulties in thermal to power inversion. These difficulties arise from measurement errors and from the inherent spatial low-pass filtering associated with heat diffusion. To address these difficulties we propose new techniques from regularization theory to invert temperature to power. Furthermore, we propose new techniques to compute the emissivities and conductances required for any infrared to power inversion method. To verify our results, a programmable circuit of micro heaters is implemented to create any desired power pattern. The thermal emissions of different known injected power patterns are captured using a state-of-the-art infrared camera, and then our characterization techniques are applied to invert the thermal emissions to power. The estimated power patterns are validated against the injected power patterns to demonstrate the accuracy of our methodology.