Short-range structure in (partially) crystalline potato starch determined with attenuated total reflectance Fourier-transform IR spectroscopy
Short-range structure in (partially) crystalline potato starch determined with attenuated total reflectance Fourier-transform IR spectroscopy
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DOI:
10.1016/0008-6215(95)00270-7
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发表时间:
1995-12-27
影响因子:
3.1
通讯作者:
Vliegenthart, JFG
中科院分区:
文献类型:
--
作者:
vanSoest, JJG;Tournois, H;Vliegenthart, JFG
A fast and direct method, based on infrared spectroscopy, for quantitative determination of starch short-range structure has been developed. The IR spectrum of starch is sensitive to changes in short-range structure in the C-C and C-O stretching region at 1300-800 cm(-1). The IR absorbance band at 1047 cm(-1) is sensitive to the amount of ordered or crystalline starch and the band at 1022 cm(-1) is characteristic of amorphous starch, The ratios (R) of the heights of the bands at 1047 and 1022 cm(-1), which expresses the amount of ordered starch to amorphous starch, and 1047 and 1035 cm(-1), which is a measure of the amount of ordered starch, showed a linear regression with the amount of potato starch having B-type crystallinity as determined with wide-angle X-ray diffractometry. The IR spectrum and thus the short-range order is also sensitive to water content. In particular, the band at 994 cm(-1), which is related to intramolecular hydrogen bonding of the hydroxyl group at C-6, is water sensitive. It is possible to quantify the IR data in terms of short-range order (S-IR) over a range of 10-50% water. The method has been applied to quantify the changes in short-range structure during the melting of potato starch with 18 or 26% (w/w) water. The amount of short-range structure and the changes during melting in the (partially) destructured starch samples concur with differential scanning calorimetry and wide-angle X-ray diffractometry measurements.